k-Space

Knowledge Base

M
"

Menu

Browse by product

kSA 400

kSA ACE

kSA BandiT

kSA Emissometer

kSA ICE

kSA MOS

kSA MOS ThermalScan

kSA MOS UltraScan

kSA RateRat Pro

kSA ScanningPyro

kSA SpectR

kSA SpectraTemp

kSA Accessories

Troubleshooting

FAQs

Document Library

Video Library

Can’t find your answer? Contact Us.

Tel: 734-426-7977 | Fax: 734-426-7955

k-Space Knowledge Base

Starting on January 1, 2025, k-Space will require Knowledge base users to sign up for an individual account.

k-Space Associates is known for its unparalleled technical support. Our talented engineers not only design and develop the metrology systems and software that you use, they also provide comprehensive solutions to our customers’ complex questions.

The k-Space Knowledge Base is intended to offer our customers another option to quickly get the answers they need. It is a convenient resource that provides informational and procedural articles, troubleshooting solutions, and FAQs related to the different k-Space metrology tools.

Request an Account or login below:

k-Space Products

kSA 400

kSA 400

Analyze Reflection High-Energy Electron Diffraction (RHEED) patterns with ...
kSA ACE

kSA ACE

Apply atomic absorption spectroscopy principles to capture in situ flux ...
kSA BandiT

kSA BandiT

Monitor absolute wafer and thin-film temperature in real-time during ...
kSA Emissometer

kSA Emissometer

Generate high-resolution maps of diffuse and specular reflectance and ...
kSA ICE

kSA ICE

Employ multiple k-Space technologies to measure thin-film temperature, ...
kSA MOS

kSA MOS

Understand and control stress in thin-film and thermal annealing processes ...
kSA MOS ThermalScan

kSA MOS ThermalScan

Scan wafers and analyze thermal stress (up to 1000C), curvature, film ...
kSA MOS UltraScan

kSA MOS UltraScan

Scan reflective samples of various sizes — from wafers to glass panels — ...
kSA RateRat Pro

kSA RateRat Pro

Measure optical constants (n and k), deposition rate, and film thickness ...
kSA ScanningPyro

kSA ScanningPyro

On Veeco K465i and EPIK700 MOCVD reactors, measure temperature variations ...
kSA SpectR

kSA SpectR

Monitor wafer and film spectral reflectance during thin-film deposition ...
kSA SpectraTemp

kSA SpectraTemp

Measure the absolute temperature of semiconductor wafers and other ...
KSA Accessories

KSA Accessories

Add options to enhance your k-Space metrology tools and make them work ...

About k-Space

k-Space Associates, Inc. is a leading manufacturer of advanced metrology systems that provide exceptional measurement and analysis capabilities. For over 30 years, our tools have been implemented in wide-ranging applications around the globe — from highly specialized research to large-scale manufacturing — in the thin-film, semiconductor, solar, automotive, glass, and building materials industries.