kSA RateRat Pro
Measure optical constants (n and k), deposition rate, and film thickness in real-time…
The kSA RateRat is a compact, easy-to-use optical metrology tool that uses a diode laser and a high-speed photo detector for thin-film characterization. The proprietary algorithm continuously updates the film optical constants to determine deposition rate, layer thickness, and optical constants (n and k) with as little as 600 Å of material deposited. The kSA RateRat is compatible with most deposition methods, including MBE, MOCVD, sputtering, and PLD.
Knowledge Base Articles
Data Acquisition and Analysis
Analyzing Single-Layer Reflectivity Data
No results found.
System and Software Configuration
Calibrating to a Known Reflectivity
kSA TCP/IP Communication Capabilities
Saving kSA Software Application Settings
Using IDL to Customize kSA Software Applications
No results found.
Applicable to Multiple k-Space Products
Assigning Specific Settings to a kSA Application Shortcut
Copying and Pasting Data From k-Space Software Applications
Data and Image Filters
Exporting Data From kSA Software Applications
k-Space Data Types and File Formats
k-Space Metrology Tools Referenced in Peer-Reviewed Journals
Sentinel Key Information
Specifying the File Name for Acquired Data
No results found.
kSA RateRat Pro
Visit the k-Space Knowledge Base Video Library to view the following kSA RateRat Pro videos.
-
-
- kSA RateRat Pro example
-