kSA SpectR
Monitor wafer and film spectral reflectance during thin-film deposition and processing…
The kSA SpectR measures absolute spectral reflectance, growth rate, and end point detection during semi-transparent thin-film deposition and processing of VCSELS, DBRs, and other complex device structures. Typical deposition methods include MBE, MOCVD, and sputtering.
Knowledge Base Articles
Data Acquisition and Analysis
Acquiring a Reference Spectrum
Preparing Spectral Data to Send to k-Space
Setting up Acquisition Delays
System and Software Configuration
Angled Viewport Adapters
kSA TCP/IP Communication Capabilities
Re-Aligning the kSA SpectR Optics Head
Saving kSA Software Application Settings
Using IDL to Customize kSA Software Applications
Applicable to Multiple k-Space Products
Copying and Pasting Data From k-Space Software Applications
Data and Image Filters
Exporting Data From kSA Software Applications
k-Space Data Types and File Formats
Sentinel Key Information
Specifying the File Name for Acquired Data
kSA SpectR Videos
Visit the k-Space Knowledge Base Video Library to view the following kSA SpectR videos.
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- Overview and Setup (12 videos)
- Installing a Spectrometer
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